Category Archives: 850

New USPC Class: 850 – Scanning Probe Techniques or Apparatus

Posted on February 8, 2009 by mjwhitekingston

The USPTO has created a new USPC class for inventions related to devices that scan or probe at the nano-scale. The full title is Class 850, Scanning-probe techniques and apparatus; applications of scanning probe techniques, e.g. scanning probe microscopy (SPM). … Continue reading →

Posted in 850, classification orders, USPC | 1 Comment