New USPC Class: 850 – Scanning Probe Techniques or Apparatus

The USPTO has created a new USPC class for inventions related to devices that scan or probe at the nano-scale. The full title is Class 850, Scanning-probe techniques and apparatus; applications of scanning probe techniques, e.g. scanning probe microscopy (SPM). The class was established under Classification Order 1885, released on Feb. 3. At this time, Class 850 consists of 63 subclasses, 1-63. No patents or published applications in the USPTO web-based database have been assigned to Class 850. This is not unusual as the classification data is updated bimonthly.

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